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Fix potential reference count leak in vinput

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In the export_store function, when vinput_register_vdevice fails, the
current error handling process calls device_unregister followed by
vinput_destroy_vdevice. However, the device_unregister here triggers its
release function, which already includes a call to
vinput_destroy_vdevice. As a result, vinput_destroy_vdevice is called
twice. Since vinput_destroy_vdevice contains module_put, this double
call must be avoided to prevent potential reference count issues.
This commit is contained in:
Bob Lee 2024-10-24 14:46:23 +08:00
parent ac1894673d
commit 3ec01e2cf1
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1 changed files with 2 additions and 0 deletions
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examples/vinput.c
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@ -284,6 +284,8 @@ static ssize_t export_store(struct class *class, struct class_attribute *attr,
fail_register_vinput: fail_register_vinput:
device_unregister(&vinput->dev); device_unregister(&vinput->dev);
/* avoid calling vinput_destroy_vdevice() twice */
return err;
fail_register: fail_register:
vinput_destroy_vdevice(vinput); vinput_destroy_vdevice(vinput);
fail: fail: